Dr. Joel Dunsmore

2026年5月21日(木)、東京科学大学 大岡山キャンパスにて、IEEE MTT-S Japan/Kansai/Nagoya Chapters 主催のDML(Distinguished Microwave Lectures)講演会が盛況のうちに開催されました。

講師として Keysight Technologies の Dr. Joel Dunsmore をお迎えしました。Dr. Dunsmore は、ベクトル・ネットワーク・アナライザ(VNA)およびVNAを用いた測定技術の研究開発を専門とする、世界的に著名な研究者の一人です。近年は特に、差動デバイス測定やミキサ測定を含む非線形測定、ならびに変調信号測定やスペクトラム測定の分野で精力的に活動されています。

Speaker: Dr. Joel Dunsmore (Keysight Technologies)

Title: Modern Methods for Component Measurements using Vector Network Analyzers

Abstract: Modern Vector Network Analyzers (VNA) have flexible hardware and software with much higher performance than VNAs of even a few years ago. There are a wide range of measurement applications, beyond simple S-parameters, that a VNA can address, and with precision that cannot be achieved by other test methods. VNAs now act as a multi-functional test system, providing an extremely wide range of device- and signal-characterization capabilities including noise figure, gain-compression, true-mode differ

ential device characterization, two-tone Inter-Modulation Distortion (IMD), phase-noise, mixer and frequency converter gain/phase/delay measurements. Very recently Vector Spectrum Analysis (VSA) capabilities have been added, including measurements of complex modulated signals such as Error Vector Magnitude (EVM), Adjacent Channel Power Ratio (ACPR) and characteristics of Digital Pre-Distortion (DPD). These capabilities, when properly configured, provide the most precise measurements of high-frequency mm-wave and sub-THz modulated signals, beyond the capabilities of stand-alone measurement instruments, as was demonstrated using 20 GHz bandwidth modulated signals at 250 GHz. This lecture illuminated the methods and capabilities for these advanced measurement methods for characterizing microwave components.

講演会終了後、Dr. Dunsmore を囲んで懇親会を開催し、親睦を深めるとともに活発な意見交換の場を持ちました。